JDK-8013941 : Remove JFR TestGCEventExplicit and TestGCEventImplict
  • Type: Bug
  • Component: hotspot
  • Sub-Component: jfr
  • Affected Version: 8
  • Priority: P3
  • Status: Resolved
  • Resolution: Fixed
  • Submitted: 2013-05-06
  • Updated: 2013-06-26
  • Resolved: 2013-05-06
The Version table provides details related to the release that this issue/RFE will be addressed.

Unresolved : Release in which this issue/RFE will be addressed.
Resolved: Release in which this issue/RFE has been resolved.
Fixed : Release in which this issue/RFE has been fixed. The release containing this fix may be available for download as an Early Access Release or a General Availability Release.

To download the current JDK release, click here.
7u40Fixed 8Fixed
Today there are three general JFR GC event tests:

- TestGCEventExplicit 
   triggers many GCs by calling System.gc()

- TestGCEventImplict 
   triggers many GCs by allocating lot's of memory

- TestGCEventAll 
   triggers even more GC by doing what TestGCEventExplicit  and TestGCEventImplict at the same time.

Since these tests run for all the different collectors they are very time consuming and the purpose of the unit tests is to verify the data, not stress the system, the TestGCEventAll shoud be sufficient.